Table 1 Instrumental techniques and their specifications.
Instrument | Model | Operating conditions |
|---|---|---|
Scanning electron microscope (SEM and EDX) | JSM-6360LA, JSM-5300JEOL, JEOL-JFC-1100E Ltd., USA | 25KV, 25000X |
Transmission electron microscope (TEM) | JEOL, JEM 1400, USA | 80KX |
XRD | X’Pert³ Powder, Netherland. | X-ray tube target: Cu voltage: 40.0 (kV), scan speed = 12.0000 (deg/min) |
Microwave oven | Model KOG-1B5H, Korea | 1400-W and 2.45 GHz. |
FT-IR | BRUKER spectrophotometer | 500–4000 cm− 1 |
GC- MS | Agilent 5977 C, USA | Scan mode |