Fig. 1

Structure and composition of the solid-state PD. (a) Cross-sectional overview SEM image of the dual-polarity core-shell n-InGaN/p-Cu2O PD structure with the SEM image of the as-grown InGaN NWs in the inset. (b) ω−2θ XRD spectra of the bare core-shell InGaN NWs and the InGaN NW/Cu2O heterostructure on Si (111). (c) PL spectrum taken at room temperature of the core-shell InGaN NWs. (d) TEM image of a single core-shell InGaN NW with the corresponding HAADF image in the inset. (e) High-resolution TEM image of the InGaN NW core with the electron diffraction image in the inset. (f) Overlaid In and Ga EDX elemental mappings. (g) In and Ga EDX intensity line scans as indicated in (f). (h) EDX spectra taken at the core and shell positions indicated in (f).