Fig. 1
From: Origin of the inhomogeneous nanoscale resistivity in chromium doped V2O3

C-AFM measurements of doped and undoped V2O3. The left column shows the topography, the right one the measured current. Because different bias voltages had to be used, the absolute current values are not comparable between doped and undoped sample. The images (c) and (d) were taken on the same film as (a) and (b), but with the sample rotated in its plane by 90°.