Fig. 3
From: Origin of the inhomogeneous nanoscale resistivity in chromium doped V2O3
(a) Dark-field STEM image of the Cr:V2O3 film grown on the membrane. The dashed rectangle highlights a grain that is magnified in (c). Here, the crystal lattice is clearly visible. Note the hexagonal symmetry, indicating that this grain is oriented with the c-axis perpendicular to the surface. (b) Relative thickness in units of the inelastic mean free path (MFP) of the electrons. (d) A cross sectional view of the membrane and the Cr:V2O3 film. This section was prepared from the frame of the membrane, because of this, the supporting silicon substrate is also visible.
