Abstract
Antiferromagnetic (AFM) materials are promising for next-generation spintronic applications, however, practical implementation remains challenging due to difficulties in controlling the Néel order and the lack of sensitive, device-compatible readout techniques. In this work, we demonstrate spin Hall magnetoresistance (SHMR) as an effective and versatile approach for probing Néel order, even in polycrystalline AFM films. Using NiO/Pt and LaNiO3/Pt bilayers as model systems, we show that SHMR measurements can detect the Néel temperature (TN), monitor spin-flop transition, and reveal field-induced orientation of the Néel order. Crucially, we establish that the control of Néel order with non-volatility is effective when initiated from the “soft” AFM phase at elevated temperature (380 K) via field-cooling (FC), enabling robust alignment of Néel order without the need for adjacent heavy metals as spin current sources. This spin-current-free control greatly expands the flexibility and scalability of AFM device design, especially in the form of polycrystalline microstructure. The results highlight the combined FC and SHMR technique as a powerful and flexible platform for both manipulation and sensitive readout of AFM states, providing a reliable basis for the design and characterization of a broad class of AFM materials and devices.
Data availability
The authors declare that the main data supporting the findings of this study are available within the article. Extra data are available from the corresponding author upon reasonable request.
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Acknowledgements
This work was supported by the National Science and Technology Council of Taiwan (NSTC) under grant NSTC 114-2124-M-A49-001/114-2221-E-A49 -119 -MY4/113-2124-M-A49-004 and was also supported by the Higher Education Sprout Project and Center for Emergent Functional Matter Science of National Yang Ming Chiao Tung University from The Featured Areas Research Center Program within the framework of the Higher Education Sprout Project by the Ministry of Education (MOE) in Taiwan. The authors would like to specially thank the assistance provided by Prof. Chang-Yang Kuo and Dr. Chun-Fu Chang for XMLD-associated measurement at TPS-45A1 NSRRC, Taiwan. Certain commercial equipment, instruments, software, or materials are identified in this paper in order to specify the experimental procedure adequately. Such identifications are not intended to imply recommendation or endorsement by NIST, nor it is intended to imply that the materials or equipment identified are necessarily the best available for the purpose.
Funding
National Science and Technology Council of Taiwan (NSTC): Grant number NSTC 114-2124-M-A49-001/114-2221-E-A49 -119 -MY4/113-2124-M-A49-004.
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CYY conceived the main concept of the study and the experiment. YCL and YLL helped deal with the film growth using sputtering and the device fabrications. CCH dealt with the transport measurements, data analyses, and XMLD experiment with the assistance of IYC. MK helped grow the epitaxial LaNiO 3 for the SHMR characterization. SCM performed the field-dependent MR measurement under the supervision of DQ. CCH organized the paper structure and prepare the draft of the manuscript. CYY, AJG, and YS revised the logic structure and modified readability of the manuscript. All the authors commented on the manuscript.
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Hsu, CC., Lin, YC., Cheng, IY. et al. Effective control and probe of Néel order in polycrystalline NiO films: a combined approach to study antiferromagnets. Sci Rep (2026). https://doi.org/10.1038/s41598-026-37152-3
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DOI: https://doi.org/10.1038/s41598-026-37152-3
