Table 4 SFX data collection and refinement statistics, Part II.

From: PEO-sheathed liquid jets increase sample delivery stability for serial femtosecond X-ray crystallography

Parameter

Sample

HEWL2+PEO

HEWL2+PEO

HEWL2+PEO

PSII+PEO3

Liquid flow rates1 (µL/min)

5+12.5

10+12.5

20+12.5

20+10

Helium flow rate (mg/min)

20.9

23.5

29.8

19.9

No. of pulses/train

352

352

352

202

No. of pulses/s

3,520

3,520

3,520

2,020

Total no. frames

3,140,046

3,140,748

3,141,450

1,321,776

No. of hits

5,067

12,617

18,128

6,166

Hit rate (%)

0.16

0.40

0.58

0.47

No. of crystals

5,407

12,371

16,961

697

No. of indexed crystals

3,745

8,501

11,664

689

Prop. of indexable hits (%)

73.91

67.38

64.34

11.17

Total indexing rate (%)

0.12

0.27

0.37

0.05

Data collection time (min)2

39.40

17.49

12.75

158.3

Unit cell lengths a,b,c (Å)

78.57/78.58/37.99

78.57/78.57/37.98

78.59/78.58/37.97

129.45/227.22/305.27

Unit cell angles\(\alpha\),\(\beta\),\(\gamma\)(°)

90.10/89.89/89.92

90.05/89.93/89.98

90.03/86.96/90.00

90.08/90.05/90.06

Resolution (Å)

19.01-1.70

19.01-1.70

19.01-1.70

15.24-4.50

 

(1.76-1.70)

(1.76-1.70)

(1.76-1.70)

(4.66-4.50)

Signal-to-noise ratio

3.97 (1.87)

5.60 (2.63)

5.96 (3.00)

1.85 (1.51)

Completeness (%)

100.00 (100.00)

100.00 (100.00)

100.00 (100.00)

83.58 (86.00)

Redundancy

63.22 (43.10)

133.64 (90.70)

159.96 (108.00)

6.84 (6.00)

Rsplit (%)

25.62 (46.28)

18.21 (31.69)

17.60 (29.64)

56.99 (79.30)

CC1/2 (%)

89.31 (75.52)

94.11 (84.49)

94.25 (86.39)

60.47 (25.42)

CC* (%)

97.13 (91.69)

98.51 (95.71)

98.51 (96.28)

86.81 (63.67)

  1. 1First value: sample flow, second value: sheath flow.
  2. 2The time it takes to acquire 10,000 indexed diffraction patterns under these conditions (considering the number of pulses, experienced hit rate and proportion of indexable hits).
  3. 3Data from proposal no. 8756 from February 2025 (12.5 keV, nano-focused beam).