Table 5 Experimental jetting parameters set at the SPB/SFX interaction region upstream (IRU) sample chamber (p\(\approx\)\(10^{-3}\) mbar), X-ray parameters and jet characterization results. The ’effective pulse energy’ considers the measured pulse energy at the XTD2 X-ray gas monitor, the selected attenuators at the XTD9 tunnel (total transmission) and that the transmission with the nano-KB mirrors is about 60%. The results from the ’scaling law’ are obtained by applying the jet velocity prediction formula from2. Jets with velocities of v\(\ge\)25 m/s are fast enough for 0.564 MHz operation, while 1.13 MHz operation is compatible with jets with v\(\ge\)45 m/s.

From: PEO-sheathed liquid jets increase sample delivery stability for serial femtosecond X-ray crystallography

Sample flow

Sheath flow

Total Q

Dilution

He flow

X-ray parameters

Jet explosion-based

characterization

Scaling law

Microscopy

Sample

Flow rate [μL/min]

Solution

Flow rate [μL/min]

[μL/min]

x-Fold

Flow rate [mg/min]

Intra-train rep. rate [Mega 1/s]

No. pulses/train

Photon energy [keV]

Pulse energy [mJ]

Transm. [%]

Eff. pulse energy [μJ]

Detector distance [mm]

Displacement between two pulses [μm]

Jet velocity [m/s]

Jet diameter calc. [μm]

Jet velocity theo. [m/s]

Jet diameter theo. [μm]

Jet diameter [μm]

HEWL

30.0

NA

0.0

30.0

1.00

27.0

0.564

202

11.0

1.49

2

18

124.3

79.3

44.7

3.77

46.2

3.71

4.28±0.87

HEWL

20.0

Water

10.0

30.0

1.50

31.0

1.128

100

11.0

0.83

47

234

124.3

41.6

46.9

3.68

48.9

3.61

3.68±0.38

HEWL

20.0

PEO 1%

10.0

30.0

1.50

28.5

1.128

352

11.0

0.75

47

212

124.3

38.5

43.5

3.83

47.2

3.67

4.12±0.19

HEWL

10.0

PEO 1%

20.0

30.0

3.00

28.4

1.128

352

11.0

0.74

47

209

124.3

35.8

40.3

3.97

47.1

3.68

4.12±0.38

HEWL2

5.0

PEO 1%

12.5

17.5

3.50

20.9

1.128

352

11.0

0.89

22

117

124.3

39.5

44.6

2.89

46.4

2.83

3.47±0.38

HEWL2

10.0

PEO 1%

12.5

22.5

2.25

23.5

1.128

352

11.0

0.91

22

120

124.3

37.7

42.5

3.35

46.3

3.21

3.68±0.38

HEWL2

20.0

PEO 1%

12.5

32.5

1.63

29.8

1.128

352

11.0

0.88

22

116

124.3

38.4

43.3

3.99

47.3

3.82

4.33±0.75

PSII

20.0

PEO 1%

10.0

30.0

1.50

19.9

0.564

202

12.5

1.10

43

284

126.6

57.9

32.7

4.42

40.8

3.95

4.41±0.63

PSII

25.0

EtOH

40.0

65.0

2.60

30.0

0.564

202

9.3

1.75

100

1050

166.0

78.1

44.0

5.60

41.2

5.79

5.21±0.19

PSI

20.0

EtOH

10.0

30.0

1.50

33.0

1.128

352

9.3

2.60

40

624

168.2

39.2

44.2

3.79

44.2

3.80

3.02±0.45

PSI

30.0

NA

0.0

30.0

1.00

33.0

1.128

352

9.3

2.57

40

617

168.2

40.1

45.2

3.75

44.2

3.80

2.81±0.32