Fig. 3
From: Raman detection of hidden phonons assisted by atomic point defects in a two-dimensional semimetal
Topographic STM images for the various surface defects in ZrSiTe. a A typical 30 × 30 nm2 atom-resolved STM image of in situ exfoliated ZrSiTe surface with defects. The zoom-in of the high-resolution STM image for the defects of types of α, β, and γ are shown in the right. The corresponding defects are marked with blue squares in the large image (a). The length of the scale bar is 6 nm in the main panel and 1 nm in the right zoom-in panels. b–d Top views of the ball-stick models of a 3 × 3 monolayer ZrSiTe with a Te vacancy, a Te adatom, and a Zr vacancy, respectively. e–g Simulated STM images of the defects shown in b–d, respectively. Compare a with e–g, the defect types of α, β, and γ can be evidently ascribed to Te vacancy, Te adatom, and Zr vacancy, respectively
