Fig. 6
From: Raman detection of hidden phonons assisted by atomic point defects in a two-dimensional semimetal
Intensity mapping of Raman scattering over a ZrSiTe flake. a The optical image of a ZrSiTe flake with various thicknesses spreading over its area. The length of the scale bar in the optical image is 5 μm. b–g Intensity maps of six Raman modes which can be observed in the sample. The monolayer can be clearly identified in the intensity map of the defect related modes at 131.7 and 143.6 cm−1. Generally, the intensity of Raman scattering decreases with the increasing thickness of ZrSiTe from 2L to higher, as shown in the map of the \(A_{1g}^1\) and \(B_{1g}^1\) modes
