Table 1 Densities of defects measured by STM.

From: Imaging and identification of point defects in PtTe2

Defect type

Defect assignment

Density of the defects observed by STM as received (1 × 1011 cm−2)

Density of the defects observed by STM after annealing at 430 °C for 3 h in UHV (1 × 1011 cm−2)

A

Te vacancy in the top row

8.1

1.4

B

Pt vacancy in the second layer

6.0

0.5

C

Te vacancy in the bottom row

10.1

1.8

D

Pt vacancy in the first layer

2.0

1.4

E

Antisite defect with Te replacing Pt

1.0

0.9

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