Fig. 1: Crystal representation, XRD and TEM analysis. | npj 2D Materials and Applications

Fig. 1: Crystal representation, XRD and TEM analysis.

From: Superposition of semiconductor and semi-metal properties of self-assembled 2D SnTiS3 heterostructures

Fig. 1

a Schematic representation of the ABAB stacking order of the SnTiS3 misfit-layer compound. b Single-crystal XRD spectrum of the grown SnTiS3 crystals. c Cross-sectional HRTEM image indicating the presence of periodic layers. d A magnified view of the alternating layers of SnS and TiS2. e A diffraction pattern collected from the zone axis [002].

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