Fig. 2: Raman scattering spectra characterization of centimeter-scale PdSe2 films. | npj 2D Materials and Applications

Fig. 2: Raman scattering spectra characterization of centimeter-scale PdSe2 films.

From: Layer-dependent optical and dielectric properties of centimeter-scale PdSe2 films grown by chemical vapor deposition

Fig. 2: Raman scattering spectra characterization of centimeter-scale PdSe2 films.

a Raman scattering spectrum of PdSe2 films with the different number of layers, the dashed line indicates a redshift of the Raman peak position from 3L to 15L. b Raman shifts value of the four main patterns relative to the number of layers from 3L to 15L. c Raman mapping spectrum of 8L PdSe2 films. The mapping range was 7*7 mm with 1 mm intervals. (i)–(iv) Characterized the Raman intensity at 146.8, 208.6, 224.1, and 146.8 cm−1, respectively. The scale bar is 1 mm.

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