Fig. 5: TR-MP-STM measurement on ripple structure formed in WS2 region. | npj 2D Materials and Applications

Fig. 5: TR-MP-STM measurement on ripple structure formed in WS2 region.

From: Ultrafast nanoscale exciton dynamics via laser-combined scanning tunneling microscopy in atomically thin materials

Fig. 5

a Schematic of nanoscale ripple structure observed in Fig. 2c. Vs = −3.5 V, Iset = 40 pA, frep = 80 MHz, fluence 13 μJ/cm2 and center wavelength 633 nm. b STM image taken over a ripple area in WS2 and the time-resolved signal acquired at the corresponding tip position on a color scale. c TR-MP-STM signal obtained along the red and blue lines in b. d Cross section along the green line in the STM image (upper figure in b), and the variation in the time constant for the corresponding position (lower figure in b). e Schematic diagram of the principle of spatially changing exciton dynamics. The error bars in d are the errors obtained with the fitting shown in c.

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