Fig. 3: Modeled Bragg reflector spectral performance.

Illustrative free-standing MoS₂ quarter-wave optical stacks with a alternating high- and low-index material layers. For the modeled reflectance responses in b, the respective exfoliated MoS₂ type was used for the high-index layer and PMMA for the low-index layer shown in a. The modeled percent reflectance for the optical stacks are shown in b with a reference wavelength of 1550 nm, a common wavelength in optical telecommunication devices. Also shown are the modeled reflectance responses as a function of angle of incidence (AOI). Solid lines represent the incident light perpendicular, or normal (0°), to the stack surface. Dashed lines represent the incident light at 45° off-normal. The legend indicates the stack high-index layer (left) and the low-index layer (right). This shows that SME MoS₂ is used as the low-index layer in lieu of PMMA for one example. Most of the differences observed in the modeled reflectance are due to changes in the index contrast (Δn) between the respective high- and low-index layers. Detailed stack coating design parameters are provided in Supplementary Note 4, Supplementary Table 2, and Supplementary Figs. 12, 13.