Fig. 1: Surface sensitive X-ray photoemission spectroscopy characterization. | npj 2D Materials and Applications

Fig. 1: Surface sensitive X-ray photoemission spectroscopy characterization.

From: Multiphase superconductivity at the interface between ultrathin FeTe islands and Bi2Te3

Fig. 1

XPS characterisation during growth of FeTe/Bi2Te3 a–h and FeSe/Bi2Se3 i–p samples. Te 4d, Se 3d and Bi 5d CL spectra, were taken on initial Bi2Ch3(0001), after 1 ML FeCh growth, and after a-Si capping (bottom, middle, and top panels). Fe 2p CLs after FeTe and FeSe formation before and after Si-capping are shown in g, h and o, p, respectively. Fits of Te 4d, Se 3d, and Bi 5d CL spectra consist of Voigt-doublet components assuming a Shirley background (grey line). For Fe 2p spectra, asymmetric Doniach-Sunjic profiles (FeDS) were used. Fitting methods are described in detail in the methods section.

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