Fig. 1: CrSBr crystal structure and photoluminescence.
a Optical image of investigated CrSBr sample on SiO2/Si substrate. The white arrows indicate the a and b crystallographic axes of the depicted flake, and the red box denotes the area covered by the AFM scan. b Atomic force microscopy image of the sample. The atomic layer thicknesses of different areas are marked in red. c Sketch of CrSBr crystal structure, crystallographic axes a, b, and c are indicated. d Photoluminescence spectra of four-layer (4L) thick CrSBr flake at T = 300 K, PL emission is measured along the a (dashed line) and b (solid line) crystallographic directions. e Polar plot of the PL intensities as a function of light polarization orientation to a b axis (0 degrees).
