Fig. 4: 100 mm MoS2 wafer transfer and corresponding material analysis as and after transfer. | npj 2D Materials and Applications

Fig. 4: 100 mm MoS2 wafer transfer and corresponding material analysis as and after transfer.

From: Water-based, large-scale transfer of 2D materials grown on sapphire substrates

Fig. 4: 100 mm MoS2 wafer transfer and corresponding material analysis as and after transfer.The alternative text for this image may have been generated using AI.

a Photograph taken during the delamination process. The dashed line indicates the propagation line of delamination from the sapphire substrate. b Photograph of delaminated MoS2 floating on DI water. The sapphire substrate can be seen remaining on the socket. c Photograph of transferred MoS2 on an oxidized 150 mm Si wafer. d AFM measurement of the as-grown material. e AFM measurement after transfer. f Color map of the characteristic A1g Raman peak position after transfer of a 45 mm × 45 mm area. g Histograms of the E12g and A1g peak positions of MoS2 as-grown (ag, blue) and after transfer (at, red). h Histograms of the FWHMs of the Raman peaks as-grown and after transfer. i Histograms of the respective I(A1g)/I(E12g) intensity ratios.

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