Extended Data Fig. 2: Signal-to-noise ratio analysis.
From: A cryo-CMOS chip that integrates silicon quantum dots and multiplexed dispersive readout electronics
a, Trace of reflectometry signal Vmw as a function of VDL1 from an individual measurement of quantum device Q13, corresponding to the black line section in the bottom left inset (left panel in Fig. 2c). The red curve is a Lorentzian fit to the experimental data. Top left inset: zoom-in of the background noise. σ is the standard deviation of noise signals. b, Trace of Vmw as a function of VDL1 for Q13 from an individual device measurement (middle panel in Fig. 3a). A is the Coulomb peak amplitude from the fit. c, Trace of Vmw as a function of VDL1 for Q13 from the time-domain multiplexing measurement (middle panel in Fig. 3c). The measurement in a was performed in a different cool down thermal cycle with respect to those in b and c, while the measurements in b and c are within the same cool down.
