Fig. 3: Operational stability of the optimized perovskite TFTs.
From: High-performance inorganic metal halide perovskite transistors
a, Continuous on/off switching test with 2,000 cycles (VGS = ±40 V) of one representative TFT based on the optimized perovskite channel. b, Consecutive transfer curve measurement results for 100 cycles (VDS = −40 V) of one optimized perovskite TFT. c, Transfer curves of one optimized perovskite TFT under negative-bias stress measurement for different durations and the recovery behaviour (open circles) (VGS = VDS = −40 V).
