Extended Data Fig. 6: In-situ kelvin probe force microscopy to observe possible long-lived metallic domains. | Nature Electronics

Extended Data Fig. 6: In-situ kelvin probe force microscopy to observe possible long-lived metallic domains.

From: Electrical control of glass-like dynamics in vanadium dioxide for data storage and processing

Extended Data Fig. 6

a, Illustration of the KPFM experimental setup with in-situ electrical excitation to monitor possible long-lived metallic domains after electrically-driven IMT. If some metallic domains can possibly survive at room temperature and are responsible for the hours-long memory, one expects to capture a nonuniform surface potential map38. b, Gradient of the KPFM signal corresponding to the post-IMT scanning indicates visually no difference between the VO2 layer and the metallic pads (serving as reference), which is not supportive for long-lived metallic domains at the resolution of the KPFM scan (~30 nm) to be responsible for the observed memory.

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