Extended Data Fig. 7: Nuclear spin lifetime. | Nature Electronics

Extended Data Fig. 7: Nuclear spin lifetime.

From: Quantum error detection in a silicon quantum processor

Extended Data Fig. 7: Nuclear spin lifetime.The alternative text for this image may have been generated using AI.

a, Nuclear spin N1 lifetime measurement, which is realised by toggling the two ESR frequencies corresponding to \(| {\Uparrow \rangle}\) and \(| {\Downarrow} \rangle\) of N1, followed by electron spin single-shot measurement. This procedure essentially constitutes a nuclear spin quantum non-demolition measurement. Each data point represents the electron spin-up fraction difference Δf, comparing \(| {\Uparrow \rangle}\) and \(| {\Downarrow \rangle}\). Each spin-up fraction is averaged over 40 single-shot measurements and conducted over ~ 80 ms. The red dotted line displays the discrimination threshold for determining whether the nuclear is in the \(| {\Uparrow \rangle}\) or \(| {\Downarrow \rangle}\). b, The quantum jumps58 are observed throughout the measurement, with the time resolution limited by the electron spin measurement speed. In the histogram of integrated signal versus Δf, the two major peaks fitted by two Gaussian curves correspond to the two nuclear spin states. The resulting error rate for nuclear spin discrimination is drawn in c, giving an error rate less than 0.1% for both \(| {\Uparrow \rangle}\) and \(| {\Downarrow \rangle}\) states assertions, with a discrimination threshold around -0.2. d, The lifetimes for \(| {\Uparrow \rangle}\) and \(| {\Downarrow \rangle}\) of N1 are measured over 6 hours, which is fitted using P(t) = Aexp(− t/T1) + B, yielding \({T}_{| \Uparrow \rangle }^{\rm{N}_{1}} \sim 174\,\rm{s}\) and \({T}_{| \Downarrow \rangle }^{\rm{N}_{1}} \sim 300\,\rm{s}\). The lifetimes of nuclear spins N2 and N3 are characterised similarly, giving \({T}_{| \Uparrow \rangle }^{\rm{N}_{2}} \sim 100\,\rm{s}\) and \({T}_{| \Downarrow \rangle }^{\rm{N}_{2}} \sim 196\,\rm{s}\), \({T}_{| \Uparrow \rangle }^{\rm{N}_{3}} \sim 153\,\rm{s}\) and \({T}_{| \Downarrow \rangle }^{\rm{N}_{3}} \sim 144\,\rm{s}\), and the nuclear spin flips are mostly caused by the ionization process during electron spin readout8.

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