Fig. 1

Characterization of exfoliated graphene on Si/SiO₂ by confocal laser scanning microscopy (CLSM), compared to other methods. a Optical microscopy, b CLSM intensity, and c CLSM height images. d Atomic force microscopy (AFM) images of the areas marked in (c). e G-peak intensity and f G/2D-peak intensity ratio. g CLSM relative intensity measured at the red points marked in b, as a function of the graphene layer thickness. h CLSM height measurement corrected with AFM height measurement for 1–5 graphene layers. Raman data were acquired with 514.5 nm excitation. The error bars indicate standard deviation of the measurement