Fig. 3

Graphene nanoribbons on SiC characterized by various methods. a Optical microscopy (OM), b confocal laser scanning microscopy (CLSM) intensity, c atomic force microscopy (AFM), d Kelvin probe force microscopy (KPFM), and e scanning electron microscopy (SEM) with InLens detector, f conductive atomic force microscopy (C-AFM) images. g–h Raman maps obtained for the same area as a–f, showing the area under the g G-peak and h 2D-peak. i Representative Raman spectra for the five regions indicated in (d), where each is an average of 64 individual spectra from the mapped data. Raman data was acquired with 532 nm excitation