Fig. 4
From: Confocal laser scanning microscopy for rapid optical characterization of graphene
Epitaxial graphene on SiC showing interfacial layer (IFL), single layer graphene (1LG), two-layer graphene (2LG) and three-layer graphene (3LG). (a) Confocal laser scanning microscopy (CLSM), (b) Kelvin probe force microscopy (KPFM), (c) conductive atomic force microscopy (C-AFM) and (d) scanning electron microscopy (SEM) image with InLens detector
