Fig. 6: Magnetic field sensitivity test. | Communications Physics

Fig. 6: Magnetic field sensitivity test.

From: Interference, diffraction, and diode effects in superconducting array based on bismuth antimony telluride topological insulator

Fig. 6: Magnetic field sensitivity test.The alternative text for this image may have been generated using AI.

Each red dot represents the mean value of N1 = 1000 critical current measurements taken at a rate of 10 point per second, at a constant magnetic field. The measurements are taken to the left of the I(B) peak, where the slope is the largest. The error bars represent the standard errors, which are calculated from each ensemble of N1 = 1000 points, by first finding the standard deviation (SD) and then calculating the standard error as SD/\(\sqrt{{N}_{1}}\).

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