Table 1 List of systematic uncertainties included in the binned profile likelihood

	Source uncertainty	Affected
		components
Amplitude	5% on the exposure	All
	15% on ³⁹Ar activity	³⁹Ar
	15% on ⁸⁵Kr activity	⁸⁵Kr
	20% on SE normalization	SE
	10% on activity from PDMs	PDMs
	10% on activity from the vessel	Vessel
	10% on activity from the TPC	TPC
	10% on neutrinos normalization	Neutrinos
Shape	atomic exchange and screening	³⁹Ar
	atomic exchange and screening	⁸⁵Kr
	1% on the ³⁹Ar-decay Q-value	³⁹Ar
	0.4% on the ⁸⁵Kr-decay Q-value	⁸⁵Kr
	SE modelling	SE
	ER ionization response	All backgrounds but CEνNS, SE
	NR ionization response	WIMP, CEνNS

Their sources and the impacted signal and background components are indicated, including spurious electrons (SE), external background from Photo Detector Modules (PDMs) and Time Projection chamber (TPC), neutrinos from coherent elastic scattering off nucleus (CEνNS) and Weakly Interacting Massive Particles (WIMP). Any considered spectrum is equally affected by the uncertainty on the dataset exposure, but differs on the ionization response on the basis of the recoil type. The pre-fit uncertainty values are adapted from DS-50 analysis¹⁴.

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