Fig. 5: Predictions as a function of the system size L_x.

a The normalized reconnection rate. b The profile f(L_x) = sech(L_x/1.28d_i) used for the black solid curves in other panels. c The limiting speed of flux transport. d The peak electron outflow speed. e The exhaust half-thickness. f The rate normalized to the electron diffusion region (EDR) quantities. The predictions with f(L_x) in (b) are shown as the black solid curves, while the green dashed curves have f = 0. Orange symbols are from the PIC simulations carried out in this paper. In (a), the blue symbols are from ref. ⁶. For comparison, the rough prediction from Eq. (1) is marked by the red dashed horizontal line, and R = 0.157 predicted for ion-coupled standard reconnection³⁵ as the magenta dashed horizontal line. In (c) and (d), the maximum plausible electron outflow value, V_Ae0, is marked as red horizontal dashed lines.