Fig. 2: Scanning ultrafast electron microscopy (SUEM) difference images of α-RuCl3 taken at high optical fluences. | Communications Physics

Fig. 2: Scanning ultrafast electron microscopy (SUEM) difference images of α-RuCl3 taken at high optical fluences.

From: Anomalously slow hot carrier cooling and insulator-to-metal transition in a photo-doped Mott insulator

Fig. 2: Scanning ultrafast electron microscopy (SUEM) difference images of α-RuCl3 taken at high optical fluences.The alternative text for this image may have been generated using AI.

a SUEM difference images taken as a function of delay time with an optical pump fluence of 400 μJ/cm2. Highly nonlinear features including a center dark region and a bright outer region emerge at higher optical fluences. b Representative SUEM image with red dashed lines indicating the regions of interest, where the line cuts shown in (c) are taken. c Line cuts of the SUEM contrast magnitude at different optical fluences, showing a reduced contrast in the center and overall suppressed contrast as the optical pump fluence is increased.

Back to article page