Fig. 3: Comparison between experimental data and simulations of the Talbot carpet from Silicon at different pump/probe intensity ratios.
d–f All hard X-ray transient grating signal of crystalline silicon as a function of the distance between the phase mask and the sample using 25 μm steps over a 500 μm scan range and related FT (g–i). Both the diffraction (red) and transmission (blue) signals are detected for: a weak pump pulse (2.5 × 10−4 μJ) at 2 fs time delay, intense probe pulse; b pump and probe pulses of comparable intensities (0.4 μJ) at 2 fs time delay; c intense pump pulse (1.9 μJ) and weak probe pulse at 10 fs time delay. The red/blue shaded areas in (d–f) represent the signal, including the standard deviation. The (a–c) panels are the real space representation of the Talbot carpets (in arb. u.) as a function of the distance (Δz) between the phase mask and the sample. The theoretical traces (black) reproduce the spatial modulation generated by the pump- and probe-induced Talbot carpets with periods of 175 μm and 255 μm, respectively. The traces have been normalized to 1.
