Fig. 2: Saturation magnetization and longitudinal resistivity.

a Temperature T dependence of the saturation magnetization M_s for films with different thicknesses. b Longitudinal resistivity ρ_xx of a 10 nm-thick Cr₂Te₃ film plotted against T. The solid red line shows fit to the data using Eq. (1) in the appropriate temperature range. Film thickness dependence of the impurity scattering coefficient \({\rho }_{xx}^{0}\) (c) and the electron-magnon scattering coefficient \({\rho }_{xx}^{{{\rm{m}}}}\) (d). For a given film thickness, results from a few devices are presented using different symbols. Definition of the symbols are the same for (c, d): see the legend shown in (c).