Fig. 5: High field longitudinal and transverse resistivities.

Transverse resistivity ρ_yx vs. out-of-plane magnetic field H_z measured at 5 K (a) and 150 K (b) for a 65 nm-thick film. (c, d) H_z dependence of the linear background-subtracted transverse resistivity \({\rho }_{yx}^{{\prime} }\). The background is determined by fitting the data in the field range of 130–140 kOe with a linear function. The horizontal dotted line in (d) is a guide to the eye. e H_z dependence of the magnetoresistance Δρ_xx of a 65 nm sample measured up to 140 kOe. f The slope ∂Δρ_xx/∂H_z of the linear line fitted to Δρ_xx vs. H_z in field ranges 0–10 kOe (black squares) and 130–140 kOe (red circles) are plotted as a function of temperature.