Fig. 4: EELS line scan along a Bi2Se3 edge with a finite grating structure.
From: Interaction of edge exciton polaritons with engineered defects in the hyperbolic material Bi2Se3
a Bright-field TEM image of the nanostructure. It is composed of an edge with elliptical grooves. The form of the boundaries was extracted as a binary image (d) and used for simulations. b, e Experimental and simulated energy-distance maps showing absorption probabilities depending on energy-loss value and probe position were extracted from the area marked with a red box in the survey image. Line profiles at selected energies (1.0 eV blue, 1.4 eV black, 2.2 eV green, 3.5 eV red) are shown in (c) and (f). They are shifted vertically for clarity. The experimental data (c) were processed by applying a Fourier transform smoothing algorithm in the plotting software, using a 5-point window (solid lines).
