Fig. 7: Redistribution of molecules as a function of the GOPS concentration.

a Smoothed ToF-SIMS depth profiles (negative polarity) conducted on the organic layers with 0, 0.1, and 1 v/v% of GOPS. CN⁻, C₈SO₃H₇⁻, SC₂O⁻, C₆₀⁻, Si₂CO⁻, and SiO₂⁻ are used as proxies respectively for PCPDTBT, PSS, PEDOT, PC₆₀BM, GOPS, and both glass and GOPS. The interface between PCPDTBT:PC₆₀BM and PEDOT:PSS is roughly at 1700 s, while the one between PEDOT:PSS and the glass substrate is roughly at 2100, 2250 and 2400 s for pristine PEDOT:PSS, with 0.1 v/v% GOPS, and with 1 v/v% GOPS, respectively. b Schematic representation of the deduced organization of the organic molecules for 0 v/v% (left) and 1 v/v% (right) of GOPS. The arrows indicate the observed delamination level within the organic layers. c, d Normalized intensities of the depth profiles for PCPDTBT (CN⁻) (c) and PEDOT (SC₂O⁻) (d) for the three GOPS concentrations.