Table 2 Results of EDX analysis.

From: Josephson current mediated by ballistic topological states in Bi2Te2.3Se0.7 single nanocrystals

Sample

Bi (at.%)

Te (at.%)

Se (at.%)

S

39.20 ± 0.44

39.36 ± 0.43

21.45 ± 0.26

SS

39.24 ± 0.51

47.12 ± 0.66

13.64 ± 0.32

SJ2

31.19 ± 1.91

52.71 ± 1.87

16.09 ± 3.19

SJ3

40.63 ± 1.08

47.05 ± 1.04

12.32 ± 0.14

SQ1

36.64 ± 0.64

49.47 ± 0.96

13.89 ± 0.13

SQ2

38.02 ± 0.49

38.02 ± 0.49

14.86 ± 0.29

  1. EDX electron-dispersive X-ray.
  2. Extracted atomic composition of the source material—S, as-grown nano-crystals—SS, and devices—SJ2, SJ3, SQ1 and SQ2, taking into account the influence of Si and Nb.
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