Fig. 4: Microprobe XAS measurements of the DGEBA-DDS/PEEK cross-section.
From: Physical and chemical imaging of adhesive interfaces with soft X-rays
a O K-edge XAS spectra by the partial-fluorescence-yield method. The XAS measurement positions 1–15 are indicated together with the corresponding O Kα and F Kα images measured at hv = 780 eV. The interface region is indicated by the white dot curve in the XRF images. b Line shape analysis using three Gaussian components for the pre-edge peak in XAS of 1, 10, and 15 after background subtraction. Energy distribution of features A and B in XAS is also shown. c Line shape analysis using four Gaussian components for the pre-edge peak in XAS of 1, 9, 10, and 15. The intensity distribution of features B1 and B2 in XAS is also shown. Fitting data for all XAS spectra are given in Supplementary Fig. 3. Error bars in panels b and c are defined as the standard deviation in the least-squares fitting using the Gaussian function.
