Fig. 3: Energy relaxation time T1 and its temporal variation.
From: Enhanced coherence of all-nitride superconducting qubits epitaxially grown on silicon substrate
a \({T}_{1}\) decay profile with an exponential fit (solid line) with \({T}_{1}=18.25\pm 0.91\;\mu\)s. The inset shows the pulse sequence for \({T}_{1}\) measurement consisting of a \(\pi\) pulse (having a Gaussian envelope) with a 40 ns duration at \({\omega }_{01}\) and a readout pulse with a 400 ns duration at \({\omega }_{r}\). b Multiple \({T}_{1}\) values obtained from 100 measurements performed over 33 h, which show the temporal stability of \({T}_{1}\). Here the error-bars correspond to the standard deviation calculated in the fitting of each decay profile. c Histogram of the \({T}_{1}\) values with a Gaussian fit with center value \({\bar{T}}_{1}=16.3\;\mu\)s and standard deviation \({\sigma }_{T1}=1.73\;\mu\)s (Solid line).
