Fig. 12: Photo-CELIV measurement of MAPbI3 perovskite films.
From: Advanced spectroscopic techniques for characterizing defects in perovskite solar cells
a Illustration of the photo-CELIV technique. Triangular pulse in reverse bias after the photoexcitation of the sample (above) results in the typical CELIV transient (below) for the calculation of carrier mobility. Reproduced with permission from ref. 76, copyright (Society of Chemical Industry, 2016). b Photo-CELIV curves of the MAPbI3 perovskite with and without iodide-based additive. Inset shows the slope A calculated from the ramp voltage. Reproduced with permission from ref. 77, copyright (Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim, 2020).
