Fig. 19: Deep-level transient spectroscopy of FAPbI3 perovskite devices. | Communications Materials

Fig. 19: Deep-level transient spectroscopy of FAPbI3 perovskite devices.

From: Advanced spectroscopic techniques for characterizing defects in perovskite solar cells

Fig. 19: Deep-level transient spectroscopy of FAPbI3 perovskite devices.The alternative text for this image may have been generated using AI.

a DLTS spectra of triiodide ions treated FAPbI3 films (target) (with the control) acquired in the temperature range of 150 to 330 K, b TRPL decay curves on the control and target perovskite films emitted at λ = 825 nm with the biexponential fitting. Reproduced with permission from ref. 97, copyright (American Association for the Advancement of Science, 2017).

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