Fig. 24: Time-of-flight secondary ion mass measurements for ion migration study in perovskite films. | Communications Materials

Fig. 24: Time-of-flight secondary ion mass measurements for ion migration study in perovskite films.

From: Advanced spectroscopic techniques for characterizing defects in perovskite solar cells

Fig. 24: Time-of-flight secondary ion mass measurements for ion migration study in perovskite films.The alternative text for this image may have been generated using AI.

a Principle of ToF-SIMS. Reproduced with permission112. Copyright 2020, Willey-VCH. b Evidence of ion migration in perovskite devices after degradation from continuous light illumination of AM 1.5G for 5 h: Elemental distribution across the devices from the cathode (Ag) to the anode (FTO), (i) MAPbI3 device, (ii) FAPbI3 device. Reproduced with permission from ref. 114, copyright (Royal Society of Chemistry, 2017).

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