Fig. 4: Evolution of diffraction profiles of the as-printed and post-annealed Ti-6Al-4V during the heating experiments. | Communications Materials

Fig. 4: Evolution of diffraction profiles of the as-printed and post-annealed Ti-6Al-4V during the heating experiments.

From: Martensite decomposition during rapid heating of Ti-6Al-4V studied via in situ synchrotron X-ray diffraction

Fig. 4

a The unit cell volumes of α’/α and β, b the changes in the lattice spacing of α’/α, c the normalized peak intensities of α’/α and β by the initial intensity of α’/α{101} in the as-printed Ti-6Al-4V, d in the post-annealed Ti-6Al-4V, e the FWHM, and f the c/a ratio of the hexagonal phases with moving average trendlines.

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