Fig. 2: Microstructure characterization for AX61-RS, AZ31-RS, AX61-FA, and AZ31-FA. | Communications Materials

Fig. 2: Microstructure characterization for AX61-RS, AZ31-RS, AX61-FA, and AZ31-FA.

From: High strength and ductility in a rare-earth free magnesium alloy processed by rotary swaging and flash annealing

Fig. 2

a EBSD inverse pole figure (IPF) map and KAM map of AX61-RS. In the IPF map, grains in red color have their <0001> axis being close to the extrusion direction, while grains in blue or green colors have their <0001> axis being nearly perpendicular to the extrusion direction. Large lattice distortion is observed, suggesting a high density of dislocations. b IPF map and KAM map of AZ31-RS. Deformation twins are prolific in the sample. c, d IPF map and KAM map of AX61-FA and AZ31-FA. e, f Two beam bright field TEM images of AX61-FA and AZ31-FA, taken along the [2\(\bar{11}\)0] axis under g = (0002) condition. AX61-FA contained many <c + a> dislocations, while AZ31-FA was free of <c + a> dislocations.

Back to article page