Fig. 2: C-AFM measurement and simulation of the in-plane potential distribution on the flake.
From: Anisotropic charge transport in 2D single crystals of Ti3C2Tx MXenes
a Current map of a C-AFM measurement on a Ti3C2Tx flake overlapping a metallic electrode and an insulating substrate, obtained with a 5 mV bias. b Current values of the profile along the dashed line in (a). The inset shows a 3D view of the AFM topography of the flake and electrode. c Simulated potential distribution on the flake for C-AFM tip at 1.5 μm from the electrode, using C-AFM current at this location as input. d Comparison between the resistance profile extracted from the C-AFM measurements (orange line) and the resistance values on the flake as obtained from the simulation for different tip-electrode distances (stars).
