Fig. 1: Synchrotron high-resolution powder X-ray diffraction (SPXRD) and X-ray Photoelectron Spectroscopy (XPS) measurement. | Communications Materials

Fig. 1: Synchrotron high-resolution powder X-ray diffraction (SPXRD) and X-ray Photoelectron Spectroscopy (XPS) measurement.

From: Enhancing magnetoresistance and mobility in Co3+xSn2-xS2 via non-stoichiometric doping for fermi level engineering

Fig. 1

(a) Rietveld refinement of synchrotron high-resolution powder X-ray diffraction pattern of x = 0.2 measured at room temperature. XPS measurement is conducted for x = 0, 0.2, and 0.3 to determine whether the non-stoichiometry introduces electron or hole doping into the synthesized compound. (b) and (c) Co 2p and Sn 3 d scan XPS spectra, respectively. Compared to the characteristic Co 2p and Sn 3 d peaks in the pristine sample (indicated by the red dashed lines), the corresponding peaks in the doped samples exhibit a clear shift toward lower binding energies (BE), indicating an increase in local electron density and consistent with electron doping.

Back to article page