Fig. 1: Properties of bulk crystals and sample exfoliation.
From: Emergence of exchange bias in van der Waals magnetic alloy CrxPt1−xTe2
a Visualization of the Cr-45% structure. The top image shows the atomic structure, while the bottom image illustrates the alternating concentration of Cr in the van der Waals layers, with Pt, Cr, and Te atoms in yellow, blue, and red, respectively. b Powder X-ray diffraction of CPT-45% (red), CPT-35% (gray), and PtTe2 (yellow) shows the introduction of a new 001 peak for CPT-45%, indicating the doubling of the unit cell along the c-axis (perpendicular to the van der Waals layers). The broad hump observed at ~15° corresponds to a background signal from the sample holder. c Superconducting quantum interference device (SQUID) magnetometry measurements of hysteresis loops of bulk CPT-45% at several temperatures with field applied along the c-axis. d Optical microscope image of an exfoliated sample of CPT-45% on Si/SiO2 substrate. This sample is approximately 300 nm thick.
