Fig. 1: Structural and charge transport properties of Mn₃Sn(0001) epitaxial thin films.

a Crystal structure of hexagonal Mn₃Sn (top) and projection on the (0001) plane (bottom). Mn atoms form a kagome-like plane and demonstrate an inverse triangular spin arrangement. b XRD patterns of the Mn₃Sn(40 nm) thin films in the absence and presence of permalloy (Py) overlayer. c Azimuthal ϕ-scan patterns of the Mn₃Sn{\(20\bar{2}1\)}, Ru{\(10\bar{1}1\)}, and MgO{202} Bragg families of planes. d XRR pattern of the MgO//Ru(3 nm)/Mn₃Sn(40 nm)/SiO_x heterostructure, where the red solid line represents the least-squares fit to the data. e Longitudinal resistance (\({R}_{{xx}}\)) as a function of temperature for a MgO//Ru(3 nm)/Mn₃Sn(40 nm)/SiO_x sample. Inset: transverse (Hall) magnetoresistance (\({R}_{{xy}}\)). f Magnetic moment density at 300 K of a 12-nm-thick Py/40-nm-thick Mn₃Sn(0001) sample for field cooled and ZFC measurement protocols.