Figure 2
From: Fabrication of [001]-oriented tungsten tips for high resolution scanning tunneling microscopy
Images of the W[001] tip apex after electron beam heating at 1000°C and ion sputtering.
(a) Bright-field TEM image and (b) electron diffraction pattern taken from the apex. (c and d) Dark-field TEM images of the apex taken with the C and D diffraction spots on panel (b).
