Figure 1
From: Suspending Effect on Low-Frequency Charge Noise in Graphene Quantum Dot
Device characterizaion.
(a) SEM image of a suspended graphene nanoribbon device and schematic of the circuit used in noise measurement. The white bar has a length of 1 μm. (b) Zoom in of a similarly-fabricated sample, indicating that the graphene is suspended. (The white cluster above is a particle of dust fallen on the sample when taking the sample off the chip carrier after measurement.) The white bar here indicates a length of 500 nm.
