Figure 6

Comparing compartmentalisation in Arp2/3 knock-down cells.
(a) Dapp(d) dependencies in IA32 MEFs and IA32 2xKD MEFs (Arp 2/3 knock-down), respectively. (b) Values of Dapp for confocal (d = 240 nm, filled columns) and STED recordings (d ~ 40 nm, open columns) in IA32 MEFs (control, dark blue) and IA32 2xKD MEFs (IA32 2xKD, light blue) – the increase in Dapp from 240 to 40 nm indicates the extent of compartmentalised diffusion. Error bars are s.e.m. Symbols on top of the columns represent results of the statistical test (**P < 0.01, *P < 0.05, NS not significant; two-tailed unpaired t test): for d ~ 40 nm comparison with the value representing d = 240 nm in the same experiment and for d = 240 nm comparison with the respective value for d = 240 nm in the control experiment. n stands for the number of cells, from r samples.