Figure 3
From: Scalable Sub-micron Patterning of Organic Materials Toward High Density Soft Electronics
Electrical characterization of organic-based transistors and conductors upon DUV irradiation.
Comparison of transfer curves of OTFT-based on (a) C8-BTBT, (b) P3HT, (c) P-29-DPPDTSE and (d) P3DDT-CNT films before and after DUV active region isolation; the curves exhibit an excellent drain-current modulation (high on/off ratio as large as ~107) by a gate bias and minimized parasitic current (IGS). CPOM image of isolated C8-BTBT OTFT is inserted as inset in (a). (e) Sheet resistance change of organic and carbon-based conductors with increased LPML and excimer lamp irradiation time, respectively. Excimer lamp irradiation with shorter wavelength and higher intensity significantly reduces the process time.
