Figure 3
From: Massive Dirac Fermion Observed in Lanthanide-Doped Topological Insulator Thin Films
Structural and chemical mapping.
(a) HAADF-STEM image of a (Dy0.113Bi0.887)2Ti3 film with marked position of measured EDX line scan (orange arrow) across the van der Waals gap. (b) Corresponding profiles of Bi-M (blue), Te-L (green) and Dy-L (red) x-ray emission intensities along the EDX line scan together with the HAADF-STEM intensity profile (black). No Dy signal is detectable in the gap.
